X-Ray Diffraction and Scattering

D2RX
Chemistry and materials Platform Science for a changing planet

Our platform regroups 8 X-ray diffractometers and a low angle X-ray diffraction/ scattering apparatus (SAXS/WAXS). This set of equipement enables us to perform various structural analyses on polycrystalline and monocrystalline compounds and on thin films, either at room temperature or under stress (temperature, pressure, humidity, gas ...). We are open to all partners (researchers, students and companies) interested in performing X-ray diffraction studies on crystallized solids.

Informations

Technical director: Frédéric Capet
Scientific director: Pascal Roussel

http://uccs.univ-lille1.fr/index.php/fr/ressources/2-non-categorise/59-diffraction-x

Bâtiment Chevreul, Avenue Paul Langevin
Campus Cité scientifique, Université de Lille
59655 VILLENEUVE D'ASCQ

Mots-clés

X-rays, Diffraction, Scattering, Crystal structure, Phase transitions, Identification, Quantification, Microdiffraction, Polymers, Thin films

Localisation

  • Composition of mixtures of crystallized phases
  • Ceramics, composites, catalysts, cements
  • Structural analysis of crystallized solids (organic or mineral, pure or in mixtures, in powdered, massive or monocrystalline form)
  • Crystal structures (organic, inorganic, organometallic)
  • Fine chemicals, organic or inorganic reagents
  • Crystallized polymers
  • Biomaterials, Nanomaterials
  • Thin layers (pole figure, reciprocal space mapping, grazing incidence, reflectometry, etc.)

Examples of projects:

  • Determination of the composition of mixtures of crystallized phases (identification, quantification) : Size of crystallites, Rietveld method
  • Studies of phase transitions under stress (high temperatures, humidity, gas, etc.)
  • Structural resolution on single crystals (ambient, high and low temperatures, high pressures) and / or on powders
  • Determination of absolute structure
  • Deformation-induced structural evolution, plasticity of polymers, X-ray diffraction- scattering, biopolymers
  • Thin layers: grazing incidence measurements, reflectometry, stress measurements, pole figures, texture, mapping of reciprocal space, rocking curves, etc

Our platform possess a wide range of equipment :

  • 1 SAXS device (Xeuss 2.0 - Xenocs) : low angle X-ray diffraction / scattering (SAXS / WAXS)
  • 2 single crystal X-ray diffractometers (DUO and Quazar – BRUKER) : structural resolution on single crystals
  • 2 ambient powder X-ray diffractometers (D8 Advance A25 –BRUKER- and X’pert pro –Malvern) : studies on polycrystalline compounds at ambient temperature
  • 2 high temperature powder X-ray diffractometers (D8 -BRUKER equipped with XRK900 and HTK1200 chambers) : studies on polycrystalline compounds from ambient temperature to 1200°C under reactive gases
  • 1 rotating anode X-ray diffractometer (SMARTLAB –RIGAKU) : thin film studies of ambient at 1100 ° C - microdiffraction
  • 1 rotating anode X-ray diffractometer (SMARTLAB XE –RIGAKU) : studies on polycrystalline compounds from -260°C to 1500°C - high resolution Kalpha1

See the detailed list of equipment.

Private
Orano, Framatome, IMRA, Solvay, Total, Roquette, CEA, Corning, EDF, Engie, IRSN, Renault, Safran, Snecma

Academic
IMT Lille Douai, Institut Jean le Rond D'Alembert (Sorbonne université), Institut Pasteur de Lille, Université d’Artois
Ecole Polytechnique Fédérale de Lausanne (Switzerland), University of Mons (Belgium), University of Brescia (Italy), University of Lisbon (Portugal)

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